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** Update – US Patent Office granted U.S. Patent No. 10,136,874 titled “Methods for Detection of Dry Rot in Grains” for the invention, “A method for detecting fungal infection of plant tissues, comprising exposing a number of kernels to a dry-rot-inducing pathogen, for a time period sufficient for the pathogen to infect the kernels and induce disease symptoms, and then detecting the presence of fungal infection in the kernels based on whether or not a pathogen-induced disease symptom was observed.”

This invention relates to the detection of pathogens in plants or plant parts and particularly to the detection of fungal pathogens in grains such as wheat. To detect fungal infection in grains, the sample or specimen is exposed to the pathogen, then the sample is cultured and observed for fungal infection.

To be applicable to wheat, the methods also were tested on a wheat sample of similar size to wheat berries and they produced the same results. Tests using both one and five wheat berries produced the same results, which indicate that sample size does not effect the results.

When performing the tests, it is not always clear where the fungal infection is, making the test results difficult to interpret. If an infection is found, visual examination is used to identify the types of infection.

More information on the methods of this invention can be found in U.S. patent application Ser. No. 12/953,102, filed Jan. 9, 2011, entitled “Method of Detecting Fungal Infection in Grains”, by the same inventor(s). This invention relates to the detection of fungal infection in grains such as wheat. To detect fungal infection in grains, the sample or specimen
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